Professor

Tadashi Abukawa

Associate Professor

Akari Takayama

Associate Professor

Taiki Hoshino

Assistant Professor

Hajime Yamamoto

Atomic-level characterization of solid surfaces and interfaces for new surface functions.

We investigate solid surfaces and interfaces at atomic level in order to create surfaces and interfaces with various functions. We have developed several original techniques for surface analysis, such as correlated thermal diffused scattering (CTDS) and Weissenberg reflection high energy electron diffraction (WRHEED). In order to study reaction and phase transition dynamics, we have developed a new method called streak camera reflection high energy electron diffraction (SC-RHEED), which captures high-speed movement of surface atoms. Photoelectron microscopy (PEEM) and scanning electron microscopy (SEM) are also used to measure non-uniform material surfaces at the nano level.

Themes

• Development of novel techniques for surface structure analysis
• Study of surface structure dynamics
• Growth and characterization of 2D atomic layer materials
• Surface analysis of micro/nano-structures