Professor

Masami Terauchi

Associate Professor

Yohei Sato

Assistant Professor

Takatoshi Matsumoto

Specially Appointed Professor

Masato Koike

Development and Applications of nm-scale Crystallography and Spectroscopies

Our lab develops accurate nanometer scale characterization methods of crystal structures by convergent-beam electron diffraction (CBED) and electronic structures by electron energy-loss spectroscopy (EELS) and soft-X-ray emission spectroscopy (SXES) for evaluating new functional materials. For performing crystal structure studies, we developed a new Ω-filter electron microscope and a refinement software, which can perform not only atom positions but also electrostatic potential and charge distributions. For electronic structure studies, a high-resolution EELS microscope and SXES instruments were developed. Figure shows carbon K-emission spectra of amorphous carbon-nitride and other carbon allotropes obtained by using a developed SXES instrument attached to a scanning electron microscope.

Themes

• Functional analysis of nm-scale particles by TEM-EELS
• Identification of electronic excitations by angle-resolved EELS
• Development of SXES instrument for electron microscopy
• Crystal structure analysis using CBED and beam-rocking ED